The structure of test system based on application built-in self-test (BIST) circuitries has been proposed. The main idea is oriented on minimization of hardware overheads and dealt with automatization of BIST-circuitries generation.
Test generator based on linear feedback shift register (LFSR) provides two types of testing - pseudorandom and deterministic.
The proposed modified Berlekamp-Massey algorithm is used for generation the LFSR polynomial coefficients.
The experimental results of technique application for some ISCAS'89 benchmark circuits have been shown
Simulation: ModelSim XE III 6.4b.
Synthesis: XiLinx ISE 10.1.