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Abstract

The structure of test system based on application built-in self-test (BIST) circuitries has been proposed. The main idea is oriented on minimization of hardware overheads and dealt with automatization of BIST-circuitries generation.

Test generator based on linear feedback shift register (LFSR) provides two types of testing - pseudorandom and deterministic.

The proposed modified Berlekamp-Massey algorithm is used for generation the LFSR polynomial coefficients.

The experimental results of technique application for some ISCAS'89 benchmark circuits have been shown

LANGUAGE USED:

VHDL

TOOLS REQUIRED:

Simulation: ModelSim XE III 6.4b.

Synthesis: XiLinx ISE 10.1.